The SmartXAFS X-ray Absorption Fine Structure (XAFS) Spectrometer features a unique design with a stationary X-ray source and a moving crystal and detector for data acquisition. It is highly sensitive to the local structure of central absorbing atoms—particularly within the 0.1 nm range—and their chemical environments. This setup provides detailed structural information at the atomic scale, revealing the arrangement of neighboring coordination shells around a characteristic atom.




