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SmartXAFS X-ray Absorption Fine Structure Spectrometer

Product number:SmartXAFS
Product description

The SmartXAFS X-ray Absorption Fine Structure (XAFS) Spectrometer features a unique design with a stationary X-ray source and a moving crystal and detector for data acquisition. It is highly sensitive to the local structure of central absorbing atoms—particularly within the 0.1 nm range—and their chemical environments. This setup provides detailed structural information at the atomic scale, revealing the arrangement of neighboring coordination shells around a characteristic atom.

Technical Specifications

XAFS Energy Range

4.5 - 18 keV(Mo) ; 4.5 - 20 keV(Ag) ; 4.5 - 22 keV(Pd) ; 4.5 - 50 keV (liquid metal target)

Energy Resolution

≤ 0.5 - 1.5 eV

XAFS Mode Repeatability

≤30 meV energy scale drift

X-ray source System

Support a variety of different target materials

High voltage up to 60 kV, current up to 40mA; power ≥ 2.2 kW

Monochromator

High purity Si/Ge crystals

Bragg Angle Range

55 - 85°

Detector

High Precision SDD Silicon Drift Detector

Sample Stage

10-position sample wheel batch automated testing




Applications

Environmental analysis、Energy materials、Biosciences、Materials science、Catalysis

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