microfocus X-ray source

Cu target, Mo target 

Optics

Multilayer single reflection focusing   mirrors

Scatterless  slit collimation system

No parasitic scattering, spot size can be   adjusted in real time, continuously and automatically

System dynamic range

2x1010

Vacuum

1 mbar

 2D   Silicon arrays single photon-counting detectors

Continuous readout, no dead time, no   readout noise or dark current

Pixel 75μm × 75μm

Dynamic range 32 bits

Automatic movement of the detector in the   direction of the incident light path throughout the vacuum line

Comprehensive system performance

Sample chamber

Extra large metal sample chamber with 120   liters of internal space

Fast switch between sample stages

No need for vacuum when switching sample   stations during normal testing, fast switching, automatic centering

Measurable scattering vector (q) range

0.007 nm-1 ~ 50 nm-1

Continuous Measurement Function

The detector continuously and   automatically acquires the full q range from 0.007 to 50 nm^-1.

Omni-directional 2D scattering Spectra   acquisition function

Automatically acquires raw 2D maps at   360° azimuth (full arc) and can be used with conventional stages, variable   temperature stages and stretching stages.

Sample stage

30 solids autosampler

40/60 powder autosampler

30 liquid capillary autosampler

20 autosampler for large block samples

Stands are compatible with both vacuum   and atmosphere environments and feature a magnetic base for quick changeover.

Software

Automatic control of equipment, automatic   data acquisition, support for batch testing and data batch processing

Windows system with real-time automatic   removal of cosmic background ray noise

Absolute scattered intensity can be   calculated directly

Automatic scanning of samples to   analyze structural changes at different locations with a resolution of ≤200   μm

Professional data fitting software,   covering a variety of common data analysis and fitting functions