X-ray diffraction (XRD) remains a key technique for crystal structure determination.  Our company has addressed the challenges of high-pressure XRD by developing a dedicated diffractometer incorporating a state-of-the-art rotating center positioning method. This innovative design facilitates both high-pressure powder diffraction and high-pressure single-crystal experiments, offering a multimodal approach within a single instrument.

1、High-Energy Microfocus X-ray Source: This instrument features a high-energy microfocus X-ray source with a small focal spot size, high flux, and short output wavelength. These characteristics offer significant improvements for core aspects of high-pressure diffraction experiments:

• （1）Ultra-high-pressure sample environment: The small focal spot size allows for effective probing of the sample even under extreme pressure conditions.

• （2）High data throughput: The high flux of the source enables rapid      data acquisition, crucial for time-sensitive high-pressure studies.

• （3）Low data background: The short output wavelength minimizes background noise, leading to enhanced data quality and improved signal-to-noise ratio for high-pressure analysis.

2、Large-Area, Single-Photon Counting Detectors:

• （1）Our instrument utilizes large-area detectors, offering increased data acquisition speed and improved diffraction data resolution while maintaining a wide detection range.

• （2）Additionally, the combination of these detectors with short-wavelength light sources facilitates the acquisition of a larger number of diffraction peaks, ultimately enhancing crystal structure resolution.

• （3）Employing a single-photon counting detector with a CdTe sensor significantly boosts the detection efficiency of short-wavelength radiation and effectively reduces background noise, leading to an improved signal-to-noise ratio for your data.

3、Five-Axis Sample Stage:

• （1）Building upon the well-established principles of the advanced center-of-rotation positioning method commonly used in synchrotron experiments, our instrument incorporates a five-axis motorized sample stage. This design allows for precise software-controlled sample scanning and centering, ensuring:

- Fixed sample-to-detector distance for consistent data quality.

- Highly accurate data collection.

- Minimization of radiation damage during user operation.

• （2）With  customizable software, the system can be configured for high-pressure single-crystal X-ray diffraction (HP-SCXRD) experiments, enabling a  multimodal approach within a single instrument.

•  1、Structural phase transitions, equations of state, elasticity, and texture at high pressures;

•  2、Materials involved include high-temperature superconductors, nanomaterials, superhard materials, minerals, bulk metallic glasses, semiconductors, and various functional materials;

•  3、Areas of application include physics, chemistry, earth/planetary sciences, materials, etc.